\documentclass{../signatures} \labacronym{AFM} \labtitle{Atomic Force Microscope} \begin{document} \maketitle \names \prelab \begin{enumerate} \item What are the major components of an AFM? How do they work together to form an image of the sample surface in Vibrating and Non-Vibrating mode? Which mode will you use in which part of this experiment? \item How does AFM differ from other forms of microscopy (e.g. SEM or optical)? What are some of the advantages and disadvantages? \item What is a piezoelectric scanner? Why are they used in our AFM? \item Draw, and briefly explain the different features of the typical Force-Distance curve for a material. Be sure to note the attractive and repulsive regions. Which AFM modes operate in each region? \item Explain what the important parameters do in the Pre-Scan, Topo Scan, and System tab (frequency select, manual Z motor control, automated tip approach, range check, scan lines, scan size, rotation, Z feedback, display, HV Z gain, XY parameters, tip approach parameters, calibration) \item Give examples of two scenarios where you are likely to break a tip. \\[36pt] \end{enumerate} \prelabsignatures \midlab On day 2 of this lab, you should have the ability to scan samples accurately and reliably. Show a processed topography scan of the calibration sample to an instructor. Take a profile of a row of features to show that your measurements and calibrations are correct. How close are your measurements compared with the datasheet? \begin{enumerate} \item What is a scanned image\’s orientation relative to the camera\’s view orientation? How does Scan Rotation change this? \item Which direction does the scanned image move if you move the physical sample to the left? What about if you move the physical sample up? \\[36pt] \end{enumerate} \midlabsignatures{2} \checkpointsection \begin{enumerate} \item \checkp{Alignments} \item \checkp{Pre-Scan Settings} \item \checkp{Calibration} \item \checkp{CD/DVD} \item \checkp{Boltzmann's Constant} \end{enumerate} \end{document}